File:Photoluminescence image calibrated with PCD on annealed silicon wafer.svg
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Summary
| Description |
English: A PCD (Photoconductance decay)-calibrated photoluminescence image showing the change in passivation quality (minority carrier lifetimes) after dark annealing a 4-inch p-type monocrystalline float zone silicon wafer coated with 10nm layer of intrinsic amorphous silicon at various temperatures for 50 seconds. The images were taken as a differential of two images registered using LumiTools ICARUS. |
| Date | |
| Source | Own work |
| Author | Radiotrefoil |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 03:50, 3 February 2023 | | 1,333 × 1,084 (1.81 MB) | Radiotrefoil | Uploaded own work with UploadWizard |
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