File:SyntheSys Research Delay Technology.JPG

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Summary

Description
English: Principle behind delay-measuring technology. Small horizontal offset between top and bottom lines represent delay that is difficult to measure (see red oval). By superimposing unrelated frequency, offset is amplified and original shift can be calculated by knowing the two superimposed frequencies. (Effect may require 100% view scaling to see)
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Author Jimwaschura
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30 May 2013

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current17:24, 30 May 2013Thumbnail for version as of 17:24, 30 May 2013882 × 418 (82 KB)JimwaschuraUser created page with UploadWizard
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