Hideo Fujiwara
Hideo Fujiwara | |
|---|---|
| 藤原 秀雄 | |
| Born | February 9, 1946 |
| Alma mater | Osaka University[7] |
| Known for | FAN algorithm[8] |
| Awards | IEEE Life Fellow[1] IEEE Computer Society Golden Core Member Award[2] IEICE Fellow[3] IPSJ Fellow[4] IEEE TTTC Lifetime Contribution Medal[5] IEEE TTTC Outstanding Contribution Awards[6] |
| Scientific career | |
| Fields | |
| Institutions | Osaka University, Meiji University, Nara Institute of Science and Technology (NAIST), Osaka Gakuin University[7] |
Hideo Fujiwara (藤原 秀雄, Fujiwara Hideo) is a Japanese computer scientist[7] who made significant contributions to ATPG (automatic test pattern generation) algorithms.[9] As one of his works, he invented the FAN algorithm in 1983,[8] which was the fastest ATPG algorithm at that time, and was adopted by industry.[10]
He was born in Nara, Japan, and studied electronic engineering at Osaka University, where he received his B.E. degree in 1969, M.E. in 1971, and Ph.D. in 1974.[7] He was with Osaka University from 1974 to 1985, Meiji University from 1985 to 1993, Nara Institute of Science and Technology (NAIST) from 1993 to 2011, and Osaka Gakuin University from 2011 to 2021. Presently, he is Professor Emeritus of NAIST.[9]
References
[edit]- ^ "IEEE Fellows Directory". Retrieved 16 June 2022.
- ^ "Golden Core Recognition, IEEE Computer Society". Retrieved 16 June 2022.
- ^ "Fellow, IEICE the Institute of Electronics, Information and Communication Engineers". Retrieved 16 June 2022.
- ^ "Fellow-Information Processing Society of Japan". Retrieved 16 August 2023.
- ^ "IEEE TTTC Lifetime Contribution Medal". IEEE TTTC. Archived from the original on 21 January 2022. Retrieved 16 June 2022.
- ^ "TTTC Outstanding Contribution Awards (OC) - IEEE TTTC". IEEE TTTC. Retrieved 16 August 2023.
- ^ a b c d e f "Personal History, Hideo Fujiwara". Retrieved 28 October 2022.
- ^ a b Fujiwara, Hideo; Shimono, Takeshi (December 1983). "On the acceleration of test generation algorithm". IEEE Transactions on Computers. C-32 (12): 1137–1144. doi:10.1109/TC.1983.1676174.
- ^ a b Hideo Fujiwara publications indexed by Google Scholar
- ^ Abramovici, Miron; Breuer, Melvin A.; Friedman, Arthur D. (1990). Digital Systems Testing and Testable Design. IEEE Press. ISBN 9780780310629.
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