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Notes on electron microscope specimen prep are under development here with wikiproject microscopy in mind.
Planar section prep[edit]
Wafer cleaving[edit]
chemwipes method[edit]
straightedge method[edit]
pliers method[edit]
Disc cutting[edit]
Abrasive thinning[edit]
Single side[edit]
Double side[edit]
Dimpling[edit]
Argon Ion Milling[edit]
Non-focused ion beam[edit]
Precision ion beam[edit]
Focused ion beam[edit]
Cross section prep[edit]
Cake method[edit]
Making the cake[edit]
Slicing the cake[edit]
Tube method[edit]
Filling the tube[edit]
Slicing the tube[edit]
See Also[edit]
